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Standard

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

2011-06-24
HISTORICAL
J1752/2_201106
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed to provide a color-enhanced representation of field strength at the scan frequency. This procedure is applicable to measurements from an IC mounted on any circuit board that is accessible to the scan probe. For comparisons, the standardized test board shall be used.
Standard

Function Performance Status Classification for EMC Immunity Testing

2013-06-12
HISTORICAL
J1812_201306
This SAE Standard provides a general method for defining the acceptable function performance status classification for the functions of automotive electronic devices upon application of the test conditions specified as described in appropriate EMC immunity test standards (for example, SAE J1113 and SAE J551). Testing of devices could be performed either on or off vehicles. Appropriate test signal and methods, Function Performance status, and test signal severity level would have to be specified in the individual cases.
Standard

Function Performance Status Classification for EMC Immunity Testing

2018-09-13
CURRENT
J1812_201809
This SAE Standard provides a general method for defining the acceptable function performance status classification for the functions of automotive electronic devices upon application of the test conditions specified as described in appropriate EMC immunity test standards (for example, SAE J1113 and SAE J551). Testing of devices could be performed either on or off vehicles. Appropriate test signal and methods, Function Performance status, and test signal severity level would have to be specified in the individual cases.
Standard

Performance Levels and Methods of Measurement of Magnetic and Electric Field Strength from Electric Vehicles, 150 kHz to 30 MHz

2012-05-11
HISTORICAL
J551/5_201205
This SAE Recommended Practice specifies measurement procedures and performance levels for magnetic and electric field emissions and conducted power mains emissions over the frequency range 150 kHz to 30 MHz, for vehicles incorporating electric propulsion systems, e.g., battery, hybrid, or plug-in hybrid electric vehicles. Conducted emission measurements in this document are applicable only to battery-charging systems which utilize a switching frequency above 9 kHz, are mounted on the vehicle, and whose power is transferred by metallic conductors. Conducted emission requirements apply only during charging of the batteries from AC power lines. Conducted and radiated emissions measurements of battery-charging systems that use an induction power coupling device are not covered by this document. The measurement of electromagnetic disturbances for frequencies from 30 MHz to 1000 MHz is covered in CISPR 12.
Standard

Electromagnetic Immunity - Off-Vehicle Source (Reverberation Chamber Method) - Part 16 - Immunity to Radiated Electromagnetic Fields

2017-10-10
HISTORICAL
J551/16_201710
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. This part of SAE J551 specifies off-vehicle radiated source test methods and procedures for testing passenger cars and commercial vehicles within a Reverberation Chamber. The method is used to evaluate the immunity of vehicle mounted electronic devices in the frequency range of 80 MHz to 2 GHz, with possible extensions 20 MHz to 10 GHz, depending upon chamber size and construction. Three methods for calibrating and applying electromagnetic fields are described in the document: 1) Mode Tuned Reverberation Chamber method, 2) Mode Stir (Standard) Reverberation Chamber method and 3) Mode Stir (Hybrid) Reverberation Chamber method.
Standard

Electromagnetic Immunity - Off-Vehicle Source (Reverberation Chamber Method) - Part 16 - Immunity to Radiated Electromagnetic Fields

2022-09-30
CURRENT
J551/16_202209
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. This part of SAE J551 specifies off-vehicle radiated source test methods and procedures for testing passenger cars and commercial vehicles within a Reverberation Chamber. The method is used to evaluate the immunity of vehicle mounted electronic devices in the frequency range of 80 MHz to 2 GHz, with possible extensions 20 MHz to 10 GHz, depending upon chamber size and construction. Three methods for calibrating and applying electromagnetic fields are described in the document: 1) Mode Tuned Reverberation Chamber method, 2) Mode Stir (Standard) Reverberation Chamber method and 3) Mode Stir (Hybrid) Reverberation Chamber method.
Standard

Electromagnetic Immunity - Off-Vehicle Source (Reverberation Chamber Method) - Part 16 - Immunity to Radiated Electromagnetic Fields

2012-05-11
HISTORICAL
J551/16_201205
Vehicle electrical/electronic systems may be affected when immersed in an electromagnetic field generated by sources such as radio and TV broadcast stations, radar and communication sites, mobile transmitters, cellular phones, etc. This part of SAE J551 specifies off-vehicle radiated source test methods and procedures for testing passenger cars and commercial vehicles within a Reverberation Chamber. The method is used to evaluate the immunity of vehicle mounted electronic devices in the frequency range of 80 MHz to 2 GHz, with possible extensions 20 MHz to 10 GHz, depending upon chamber size and construction. Three methods for calibrating and applying electromagnetic fields are described in the document: 1) Mode Tuned Reverberation Chamber method, 2) Mode Stir (Standard) Reverberation Chamber method and 3) Mode Stir (Hybrid) Reverberation Chamber method.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2017-09-22
CURRENT
J1752/3_201709
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
Standard

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

2011-06-17
HISTORICAL
J1752/3_201106
This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in the cell as in the conventional usage but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured RF voltage is affected by the septum to test board (wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to wall spacing of 45 mm and a GTEM cell with average septum to wall spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations.
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